Dual Beam

Seiko Xvision 200TBS

ID# :
Manufacturer : Seiko
Vintage : 2012
Category : Dual Beam
Detail

SYSTEM CONFIGURATION

  • me-GUN TYPE :SE image Resolution 4nm@30KV Max Probe current : 45nA Acceleration Voltage : 1 to 30KV
  • E-GUN TYPE : SE image Resolution 3nm@5KV Acceleration Voltage : 1 to 30KV Electron Source : Thermal Field Emission Type(ZrO/W)
  • BEAM CURRENT : Max probe current 45nA
  • DEPO SYSTEM : Pt, C
  • VACUUM TYPE : Turbomolecular Pump ,mechanical Pump, Ion getter pump
  • STAGE TYPE : 200mm specimen compatible stage 5 Axis motor operation : XY feed-back control
  • LOADLOCK TYPE : Loadlock
  • PS/OS : Xvision 5.1.8
  • DERECTOR : SEM Column Integrated In-Lens SE/BSE Secondary Electron Detector Installed in teh Main Chamber

 

*The system is operating in Taiwan service Lab dealing with failure analysis and TEM sample prep jobs.