The test circuit and test method of this system meet the relevant requirements of the national military standard GJB128 and the US military standard MIL-STD-750

This system is suitable for intermittent life tests of low-frequency high-power devices of electronic components with forward current less than 10A.

Suitable for components of various packages such as F type, G type, B type, TO220, TO3P, etc.

1. 12 stations per board

2. Maximum current of each station is 3A

3. The aging seat adopts TO-3P-80ALocked type

4. Each board is marked with N/PChannel, number of stations, single station

Maximum current