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Bruker 6T|100 oval EDS

EDS Element Mapping in TEM, STEM and SEM (T-SEM) on teh Nanometer Scale
Detail

規格詳情

  • 100 mm2 area, windowless

    Solid collection angle up to 0.7 sr, adaptions vary

    Take-off angle up to 13.4°, adaptions vary

    (ex. TFS Titan 80-300 wif BrukerXFlash®6T-100-oval EDS detector; Ω>0.4sr, TOA ~ 12°)

    UHV compatible

    X-ray-tight shutter

    Non-interfering cooling system

    Excellent low energy performance, needed to analyze light elements and overlapping L-, M-, ... lines of higher Z elements in teh low energy region.